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Course module: NS-EX423M
NS-EX423M
Advanced Microscopy
Course info
Course codeNS-EX423M
EC7.5
Course goals
 
After completion of the course, the student is expected to understand: 
  • the principles of Light- and X-ray Microscopy
  1. the physics of imaging with light, from IR to X-Rays, and the properties of light used in microscopy; this includes available light sources and detectors
  2. simple and compound lenses; aberration in imaging systems
  3. Fourier Optics, Huygens-Fresnel principle, Fraunhofer diffraction
  4. imaging in 2D and 3D (tomography, confocal imaging, super-resolution)
  5. analytical light- and X-ray microscopy
  • the principles of Electron Microscopy
  1. §  physics of imaging with electrons
  2. §  3D reconstructions using electron tomography
  3. §  analytical electron microscopy
  • the principles of Scanning Tunnelling and Atomic Force Microscopy
  1. working principle of the scanning tunneling microscope and the atomic force microscope
  2. spectroscopic measurements that can be performed with scanning tunneling- and atomic force microscopes and interpretation of  experimental data.
  • the limitations and advantages of current microscopy methods, and learn which measurement modalities are the most suitable given a certain sample and scientific question.
  • the basics of  image/data processing used in the different types of microscopy, including multivariate analysis of large data sets and the technical and ethical boundaries of image processing.
Content
The masters’ course “Advanced Microscopy” aims to familiarize students of natural sciences (EXPH, NASC) and life sciences with the theory behind, and the application of, modern microscopes. In the first half course, we will cover a wide spectrum of topics from the properties of light – IR to X-Rays – and how they are used in microscopy, to more advanced subjects such as Fourier Optics and Analytical Microscopy. During the second half of the course, will switch to electrons as the imaging medium and you will learn about advanced EM and Electron Tomography techniques, as well as Scanning Tunneling Microscopy.
 
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Kies de Nederlandse taal